Hitachi Microscope & Magnifier S-4800 User Manual

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FOREWORD - 1
FOREWORD
 
APPLICATION 
  The S-4800 SEM utilizes electron beam accelerated at 500 V to 30 kV.   
The instrument is designed mainly for observation and evaluation of 
specimens prepared for observation using SEM. 
  Note that Hitachi High-Technologies Corporation will not be responsible 
for injury or damage caused by usage of the instrument in a manner not 
described in this manual. 
CAUTION 
The electron microscope need not conform to the “Radiation Hazard   
Preventive Laws” or “Ionizing Radiation Hazard Preventive Regulations” 
currently in effect throughout the world, unlike the instruments 
designed to produce x-rays. 
The suggestion made by the ICRP (International Committee on Radiation 
Hazard Prevention), however, clearly defines that the electron 
microscope, like the home television set, will potentially produce a certain 
amount of x-rays as an undesirable byproduct.    From a safety viewpoint, 
therefore, it is essential to operate the instrument carefully taking into 
account the following fundamental precautions. 
 
(1)  Use the instrument within the application range specified in the 
catalog or instruction manual. 
(2)  Do not operate the instrument with covers or doors removed, nor use 
alternatives for these components. 
(3) 
Do not apply modifications which may possibly result in deactivation 
of the built-in safety devices. 
CAUTION 
Viewing the screen of the computer monitor and/or operating the computer 
keyboard for prolonged, uninterrupted periods of time may result in fatigue 
or other problems such as eye strain or repetitive motion injuries.   
Therefore, Hitachi High-Technologies Corporation recommends that the 
user carefully consider these potential risks when establishing guidelines 
for proper use of this instrument in their workplace.